Error detection/correction and fault detection/recovery – Pulse or data error handling – Replacement of memory spare location – portion – or segment
Reexamination Certificate
2007-01-15
2009-08-25
Chung, Phung M (Department: 2117)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Replacement of memory spare location, portion, or segment
C714S718000
Reexamination Certificate
active
07581146
ABSTRACT:
A semiconductor memory device including a memory array having a plurality of memory cells and a data input/output unit. A part of the memory array is assigned as a repair information region. The repair information region has a plurality of information packets. The data input/output unit reads a first and a second information packet of the plurality of information packets. The second information packet is read according to a link bit address of the first information packet.
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Chung Phung M
F. Chau & Associates LLC
Samsung Electronics Co,. Ltd.
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