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Semiconductor integrated circuit and its evaluating method

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Patent

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Semiconductor integrated circuit and memory test method

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate

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Semiconductor integrated circuit and method for testing a...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Semiconductor integrated circuit and method for testing same

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Semiconductor integrated circuit and method for testing the...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Semiconductor integrated circuit and method for testing the...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate

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Semiconductor integrated circuit and method for testing the...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Semiconductor integrated circuit and method for testing...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Semiconductor integrated circuit and method of checking memory

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Semiconductor integrated circuit and method of detecting...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Semiconductor integrated circuit and method of testing same

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Semiconductor integrated circuit and method of testing the same

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Semiconductor integrated circuit and method of testing the same

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Semiconductor integrated circuit and recording medium

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Semiconductor integrated circuit and recording medium

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Semiconductor integrated circuit and redundancy method thereof

Error detection/correction and fault detection/recovery – Pulse or data error handling – Replacement of memory spare location – portion – or segment
Reexamination Certificate

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Semiconductor integrated circuit and scan test method therefor

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Semiconductor integrated circuit and scan test method therefor

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Semiconductor integrated circuit and semiconductor...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Semiconductor integrated circuit and system LSI having a...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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