Semiconductor integrated circuit and redundancy method thereof

Details Semiconductor integrated circuit and redundancy method thereof Semiconductor integrated circuit and redundancy method thereof

2011-03-15

2011-03-15

Beausoliel, Robert (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Replacement of memory spare location, portion, or segment

C714S710000, C365S201000

Reexamination Certificate

active

07908527

ABSTRACT:
A semiconductor integrated circuit includes a main memory cell array, redundancy memory cell array, memory macro and repair information transferring circuit. A repair information analyzing circuit fetches repair information of transferred unit repair information therein, outputs the repair information to the memory macro having a redundancy repair mechanism and subjects the memory macro to a redundancy repair process by the redundancy repair mechanism of the memory macro in a case where memory identification information of the transferred unit repair information coincides with memory identification information stored in a nonvolatile memory element.

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