Semiconductor integrated circuit and system LSI having a...

Details Semiconductor integrated circuit and system LSI having a... Semiconductor integrated circuit and system LSI having a...

2005-09-27

2010-06-15

Kerveros, James C (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S733000, C714S738000

Reexamination Certificate

active

07739571

ABSTRACT:
In a semiconductor integrated circuit11, there is constructed a test expected value programming circuit100having an input/input-output pad103for retrieving a ground/power-source signal104from a ground terminal30or a power source terminal31connected to the semiconductor integrated circuit11, a switch105for selectively switching the outputting of the ground/power-source signal104inputted via the input/input-output pad103, and an expected value generation circuit13for generating a test expected value signal21based on a switch output signal122outputted from the switch105.

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Japanese Office Action, with English translation, issued in Japanese Patent Application No. 2007-500418, mailed Aug. 25, 2009.

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