Semiconductor integrated circuit and method of testing the same

Details Semiconductor integrated circuit and method of testing the same Semiconductor integrated circuit and method of testing the same

2010-05-26

2011-11-08

Tabone, Jr., John J (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S726000, C714S731000

Reexamination Certificate

active

08055965

ABSTRACT:
A semiconductor integrated circuit includes: a plurality of scan flip-flops configured to form a scan chain in a scan test; and a plurality of clock gating circuits connected between a clock input and corresponding portions of the plurality of scan flip-flops, respectively. The plurality of clock gating circuits are connected in serial to form a chain and gating setting data is inputted in serial through the chain connection. Each of the plurality of clock gating circuits controls a connection between the clock input and a corresponding portion of the plurality of scan flip-flops based on the gating setting data.

REFERENCES:
patent: 5900753 (1999-05-01), Cote et al.
patent: 6275081 (2001-08-01), Flake
patent: 6442722 (2002-08-01), Nadeau-Dostie et al.
patent: 7058868 (2006-06-01), Guettaf
patent: 7089471 (2006-08-01), Guettaf
patent: 7134061 (2006-11-01), Agashe et al.
patent: 7290191 (2007-10-01), Grise et al.
patent: 7383481 (2008-06-01), Warren et al.
patent: 7456674 (2008-11-01), Oakland
patent: 7698613 (2010-04-01), Kudo
patent: 2003/0154434 (2003-08-01), Hou
patent: 2007/0200597 (2007-08-01), Oakland
patent: 2007/0226565 (2007-09-01), Kudo
patent: 2008/0115005 (2008-05-01), Kamada
patent: 2009/0240997 (2009-09-01), Hasegawa
patent: 2007-248135 (2007-09-01), None

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