Semiconductor integrated circuit and method of detecting...

Details Semiconductor integrated circuit and method of detecting... Semiconductor integrated circuit and method of detecting...

2011-06-07

2011-06-07

Gaffin, Jeffrey A (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Memory testing

C714S733000

Reexamination Certificate

active

07958415

ABSTRACT:
Disclosed is a semiconductor integrated circuit that allows a fail path to be detected. A semiconductor integrated circuit as described herein can be configured to include a data register that can receive input data to generate and store a write expectation value and a read expectation value, during a period in which a test mode is activated, a first comparing unit that compares write data written in a memory cell with the write expectation value, and a second comparing unit that compares read data read from the memory cell with the read expectation value.

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