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Selected: P

Pattern generator and electric part testing apparatus

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Pattern generator and memory testing device using the same

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Pattern generator and test apparatus

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Pattern generator for a semiconductor integrated circuit tester

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Patent

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Pattern generator for memory burn-in and test

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Patent

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Pattern generator for semiconductor test system

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Pattern generator for semiconductor test system

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Patent

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Pattern generator for semiconductor test system

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Pattern generator for use in a semiconductor test device

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Pattern matching to validate and classify computer variables...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Pausing a transfer of data

Error detection/correction and fault detection/recovery – Pulse or data error handling – Error count or rate
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PBA recovery apparatus and method for interleaved reed-solomon c

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction
Patent

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PC and ATE integrated chip test equipment

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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PC-connectivity for on-chip memory

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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PCI express physical layer built-in self test architecture

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Peak error detector

Error detection/correction and fault detection/recovery – Pulse or data error handling – Error/fault detection technique
Reexamination Certificate

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Performance built-in self test system for a device and a...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Performance control of an integrated circuit

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Performance evaluation method, performance evaluation...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Error count or rate
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Performance evaluation of multicarrier channels

Error detection/correction and fault detection/recovery – Pulse or data error handling – Error count or rate
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