Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2007-01-08
2009-10-13
Kerveros, James C (Department: 2117)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
Reexamination Certificate
active
07603605
ABSTRACT:
An integrated circuit is provided with a test circuit element and one or more further circuit elements. The performance of the test circuit element at various settings of a performance controlling parameter is determined. That performance controlling parameter is then applied across the one or more further circuit elements. The integrated circuit may include memory banks and the performance controlling parameter can be sense amplifier timing, delay line length or another parameter such as operating voltage, operating frequency and circuit timing in general.
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ARM Limited
Kerveros James C
Nixon & Vanderhye P.C.
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