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Logic analyzer probe assembly with probe and interface boards

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Patent

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Logic analyzer systems and methods for programmable logic...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Logic built-in self test

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Logic built-in self test (BIST)

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Logic built-in self test selective signature generation

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Logic built-in self-test channel skipping during functional...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Logic circuit and method for designing the same

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Patent

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Logic circuit and methods for designing and testing the same

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Logic circuit protected against transient disturbances

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Logic circuit protected against transient disturbances

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction
Reexamination Certificate

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Logic circuit protected against transient disturbances

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction
Reexamination Certificate

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Logic circuit test apparatus and logic circuit test method

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Logic circuit testing with reduced overhead

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Logic circuit verification apparatus and method for...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Utility Patent

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Logic circuit verification device for semiconductor integrated c

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Patent

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Logic circuitry and recording medium

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Logic circuitry having self-test function

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Logic device and method supporting scan test

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Logic synthesis for testability system which enables improvement

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Patent

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Logical data block, magnetic random access memory, memory...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction
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