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Integrated circuit device

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Integrated circuit device having an internal state...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Integrated circuit device including a circuit to generate...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction
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Integrated circuit device including a scan test circuit and...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Integrated circuit devices that include self-test apparatus...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Integrated circuit devices with mode-selective external...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Integrated circuit fault insertion system

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Integrated circuit fault tester, integrated circuit fault...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Integrated circuit for writing and reading registers...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Integrated circuit having a data processing unit and a...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Replacement of memory spare location – portion – or segment
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Integrated circuit having a self-test device and method for...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Integrated circuit having a subordinate test interface

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Integrated circuit having a test cell that resynchronizes...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Integrated circuit having distributed control and status...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Integrated circuit having electrically isolatable test...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Integrated circuit having electrically isolatable test...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Integrated circuit having memory array including ECC and...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Replacement of memory spare location – portion – or segment
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Integrated circuit having memory built-in self test (BIST) for d

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Integrated circuit having multiple modes of operation

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction
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Integrated circuit having multiple modes of operation

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction
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