Integrated circuit having a subordinate test interface

Details Integrated circuit having a subordinate test interface Integrated circuit having a subordinate test interface

2007-04-05

2010-10-05

Chung, Phung M (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S724000, C714S726000, C714S763000, C714S807000

Reexamination Certificate

active

07810004

ABSTRACT:
An integrated circuit having a subordinate test interface and method for transmitting digital data is disclosed. The integrated circuit includes at least one test interface that is adapted to write and read data in and from a data memory, the at least one test interface includes, for transmitting and receiving data of different content categories, one signal line each for every content category. The integrated circuit further includes an interface module for receiving and transmitting data, and that the interface module is, via the signal lines, connected with the test interface for transmitting the data of the different content categories.

REFERENCES:
patent: 6088822 (2000-07-01), Warren
patent: 6381721 (2002-04-01), Warren
patent: 6823282 (2004-11-01), Snyder
patent: 7099963 (2006-08-01), Byers et al.
patent: 2001/0034598 (2001-10-01), Swoboda
patent: 2004/0001432 (2004-01-01), Wescott

Affiliated with

Also associated with

Rating

Integrated circuit having a subordinate test interface does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Integrated circuit having a subordinate test interface, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Integrated circuit having a subordinate test interface will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-4177345