Integrated circuit device having an internal state...

Details Integrated circuit device having an internal state... Integrated circuit device having an internal state...

2006-02-07

2006-02-07

Chase, Shelly (Department: 2133)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S723000

Reexamination Certificate

active

06996754

ABSTRACT:
An integrated circuit device for testing is disclosed. The device includes a plurality of internal circuits for generating a plurality of internal signals, the internal signals used for addressing storage locations and for controlling internal operations, a first selection circuit for receiving the internal circuits in response to selection signals corresponding to test information signals, a second selection circuit for receiving output signals from the first selection circuit and output signals from a sense amplifier, and for opening an alternative one of transfer paths of the internal signals and the output signals in response to the selection signals, and a data output buffer for transferring output signals from the second selection signals to an outside of the device through data input/output pads.

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