Integrated circuit having a data processing unit and a...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Replacement of memory spare location – portion – or segment

Reexamination Certificate

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Details

C714S718000, C714S006130, C365S200000

Reexamination Certificate

active

07047454

ABSTRACT:
An integrated circuit includes a data processing unit, a buffer memory, and a setting memory. The buffer memory performs the function of registers for storing data for the processing unit. The buffer memory is connected to the setting memory. The setting memory can be written to through the buffer memory.

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Dreibelbis et al., “Processor-Based Built-In Self-Test for Embedded DRAM”, IEEE Journal of Solid State Circuits, vol. 33 No. 11, Nov., 1998, pp1731-1740.
Tarr M. et al.: “Defect Analysis System Speeds Test and Repair of Redundant Memories”, Electronics, Jan. 12, 1984, pp. 175, 177, 179.

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