Circuit and method for time-efficient memory repair

Circuit and method for varying a pulse width of an internal...

Circuit and method providing dynamic scan chain partitioning

Circuit and method to prevent inadvertent test mode entry

Circuit and method to prevent inadvertent test mode entry

Circuit and method to prevent inadvertent test mode entry

Circuit and signal encoding method for reducing the number...

Circuit and/or method for automated use of unallocated...

Circuit apparatus and method for testing integrated circuits...

Circuit arrangement and method for checking the function of...

Circuit arrangement and method for driving electronic chips

Circuit arrangement and method for driving electronic chips

Circuit arrangement and method for minimizing bit errors

Circuit arrangement and method of testing an application...

Circuit arrangement for processing data

Circuit arrangement having a number of integrated circuit...

Circuit arrangement, electronic mechanism, electrical turn...

Circuit cell for test pattern generation and test pattern...

Circuit cell having a built-in self-test function, and test...

Circuit configuration for the burn-in test of a...