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Test circuit for testing a synchronous memory circuit

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate

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Test circuit of semiconductor integrated circuit

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Test clocking scheme

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Test data reporting and analyzing using data array and...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Test device

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Test device, test system and method for testing a memory...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Test for processor memory cache

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Test interface for verification of high speed embedded...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Test method and apparatus for semiconductor device

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Test method and apparatus for writing a memory array with a redu

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Patent

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Test method and test apparatus for an electronic module

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Test method and test device for electronic memories

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Test method and test system for semiconductor device

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Test method for data storage characteristics of memory

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Test method for determining the wire configuration for...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Test method for guaranteeing full stuck-at-fault coverage of...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Test method for nonvolatile memory

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Test method of cache memory of multiprocessor system

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Utility Patent

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Test mode circuit of semiconductor memory device

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Test mode control circuit

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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