Test device

Details Test device Test device

2006-06-30

2009-06-02

Trimmings, John P (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Memory testing

C714S014000, C714S022000, C714S025000, C714S724000, C714S718000, C714S743000, C714S799000, C702S057000, C702S058000, C702S059000, C702S060000, C702S063000, C702S064000, C713S340000

Reexamination Certificate

active

07543199

ABSTRACT:
A test device that can improve test reliability is provided. In the test device, an error detecting unit detects an error of inputted test signals to generate an error flag, a normal test unit performs a test operation according to the test signals when the error flag is deactivated, and an error information providing unit indicates the error of the test signals when the error flag is activated.

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English translation of Taiwanese Office Action issued in Taiwanese Patent Application No. TW 095124094, mailed May 29, 2008.

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