LandOfFree - US Patents - Listing for X-ray or gamma ray systems or devices,Specific application,Diffraction, reflection, or scattering analysis

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

X-ray reflectivity measurement

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

X-ray reflectivity system with variable spot

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

X-ray reflectometer

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

X-ray reflectometer

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

X-ray reflectometer

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

X-ray reflectometry of thin film layers with enhanced accuracy

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

X-ray reflectometry of thin film layers with enhanced accuracy

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

X-ray reflectometry system with multiple sample holder and...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

X-ray reflectometry with small-angle scattering measurement

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

X-ray scanner with secondary radiation detector

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

X-ray scatter image reconstruction by balancing of...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

X-ray scattering with a polychromatic source

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

X-ray source and detector configuration for a...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

X-ray spectrometer and apparatus for XAFS measurements

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

X-ray spectrometer having a doubly curved crystal

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

X-ray spectroscope

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

X-ray spectroscopic analyzing apparatus

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

X-ray system

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

X-ray thickness gauge