X-ray spectrometer having a doubly curved crystal

Details X-ray spectrometer having a doubly curved crystal X-ray spectrometer having a doubly curved crystal

1989-03-29

1990-08-14

Howell, Janice A.

X-ray or gamma ray systems or devices

Specific application

Diffraction, reflection, or scattering analysis

378 82, G21K 106

Patent

active

049493671

ABSTRACT:
An X-ray analysis crystal is also curved in a direction transverse to the dispersion direction to increase the radiation efficiency. As a result of this radiation diffracted at the crystal is focused towards a detector input. In order to ensure a non-deformable crystal surface the crystal is preferably bonded to a carrier having an adapted bonding profile.

REFERENCES:
patent: 2853617 (1958-09-01), Berreman
patent: 3439163 (1969-04-01), De Jongh
patent: 4351063 (1982-09-01), Dineen et al.
patent: 4525853 (1985-06-01), Keem et al.
patent: 4562585 (1985-12-01), Gobel et al.
patent: 4649557 (1987-03-01), Hornstra et al.
patent: 4780899 (1988-10-01), Adema et al.
patent: 4807268 (1989-02-01), Wittry
"Concept and Design Procedure for Cylindrical Element Monochromators . . . ", by Chem Nuclear Instruments and Methods in Physics Research (1987), pp. 595-604.

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