X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent
1996-12-06
1998-08-04
Porta, David P.
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
378 85, G01N 2322
Patent
active
057906289
ABSTRACT:
The following arrangement is adopted to achieve an X-ray spectroscope capable of simultaneously spectrally analyzing, with a single spectral scanning, X-rays emitted from a point-like X-ray source in a plurality of wavelength ranges such that X-rays in a wide wavelength range can spectrally be analyzed with a single spectral scanning. In an X-ray spectroscope in which a point-like X-ray source, a spectral crystal and a X-ray detector are disposed along a Rowland circle and in which, with the distance between the X-ray source and the spectral crystal maintained equal to the distance between the spectral crystal and the X-ray detector, this distance is continuously changed such that the wavelength of X-rays to be spectrally analyzed is continuously changed, the X-ray spectroscope is characterized in that the spectral crystal comprises a plurality of arcuate crystals for spectrally analyzing respective X-rays different in wavelength, that at least one of the arcuate crystals is located at a position apart from the reference plane including the Rowland circle and that the X-ray detector comprises at least one X-ray detector for detecting the X-rays diffracted by the arcuate crystals.
REFERENCES:
patent: 3160747 (1964-12-01), De Vries
patent: 3980568 (1976-09-01), Pitchford et al.
patent: 4134012 (1979-01-01), Smallbone et al.
patent: 4796284 (1989-01-01), Jenkins
patent: 4852135 (1989-07-01), Anisovich et al.
Porta David P.
Shimadzu Corporation
LandOfFree
X-ray spectroscope does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with X-ray spectroscope, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and X-ray spectroscope will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1186642