X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate
2008-09-10
2010-06-22
Kiknadze, Irakli (Department: 2882)
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
C378S071000, C378S057000
Reexamination Certificate
active
07742563
ABSTRACT:
A system and method for scanning objects using a non-translational x-ray diffraction (XRD) system is disclosed. The system includes a scanning area through which an object to be scanned traverses and a distributed x-ray source having a plurality of focal spot locations. The distributed x-ray source is affixed on the scanning area and is configured to emit x-rays towards the object as a series of parallel x-ray beams. A stationary detector arrangement is affixed on another side of the scanning area generally opposite the distributed x-ray source and is configured to measure a coherent scatter spectra of the x-rays after passing through the object. A data acquisition system (DAS) is connected to the detector arrangement and is configured to measure the coherent scatter spectra, which is utilized to generate XRD data and determine a material composition of at least a portion of the object from the XRD data.
REFERENCES:
patent: 6693988 (2004-02-01), Harding
patent: 6917667 (2005-07-01), Fujinawa et al.
patent: 7092485 (2006-08-01), Kravis
patent: 2002/0097836 (2002-07-01), Grodzins
patent: 2005010512 (2005-02-01), None
patent: 2007149751 (2007-12-01), None
De Man Bruno K. B.
Edic Peter Michael
Harding Geoffrey
Strecker Helmut Rudolf
Armstrong Teasdale LLP
Kiknadze Irakli
Morpho Detection Inc.
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