X-ray spectroscopic analyzing apparatus

Details X-ray spectroscopic analyzing apparatus X-ray spectroscopic analyzing apparatus

1991-09-04

1992-07-21

Church, Craig E.

X-ray or gamma ray systems or devices

Specific application

Diffraction, reflection, or scattering analysis

378 49, 378 83, G21K 106

Patent

active

051329972

ABSTRACT:
An X-ray spectroscopic analyzing apparatus which comprises a source of X-rays, a first analyzing crystal for diffracting the X-rays from the X-ray source, and a second analyzing crystal for diffracting the X-rays from the X-ray source and also for passing therethrough a diffracted X-ray component from the first analyzing crystal. The first and second analyzing crystals are so disposed and so positioned as to permit the diffracted X-ray components of different wavelengths to travel along a single path towards a sample to be analyzed. On an optical path extending between the X-ray source and the sample, a filtering means for cutting a portion of the X-rays which has a wavelength shorter than a predetermined wavelength.

REFERENCES:
patent: 4884290 (1989-11-01), Tamura et al.

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