X-ray scanner with secondary radiation detector

Details X-ray scanner with secondary radiation detector X-ray scanner with secondary radiation detector

1988-10-05

1989-09-26

Howell, Janice A.

X-ray or gamma ray systems or devices

Specific application

Diffraction, reflection, or scattering analysis

378 62, 378 90, G01N 23203

Patent

active

048706701

ABSTRACT:
An article inspection system has separate detectors for primary radiation and scattered radiation which are generated by an article upon being irradiated with X-radiation. The scattered radiation detector is disposed so that no primary radiation is incident thereon. The primary radiation detector is scanned at a frequency to produce a primary radiation image. The scattered radiation incoming to the scattered radiation detector is modulated at a frequency synchronized with the scanning frequency for the primary radiation detector, so that only scattered radiation is incident on the scattered radiation detector which emanates from the region of the article which is currently being scanned for primary radiation.

REFERENCES:
patent: 3927318 (1975-12-01), Macovski
patent: 4047029 (1977-09-01), Allport
patent: 4229651 (1980-10-01), Danos
patent: 4366382 (1982-12-01), Kotowski
patent: 4495636 (1985-01-01), Jacobs et al.
"On The Sensitivity and Application Possibilities of a Novel Compton Scatter Imaging System", Harding, IEEE Transactions on Nuclear Science, vol. NS-29, No. 3, Jun. 1982, pp. 1260-1265.
"Luggage Control With X-Ray Eyes," Linkenbach et al., Siemens Review, vol. 48, No. 6, Nov./Dec. 1981.

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