X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent
1982-12-07
1985-04-23
Church, Craig E.
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
378 82, G01N 2320
Patent
active
045134340
ABSTRACT:
An echelon arrangement of Bragg-angle X-ray or gamma ray reflectors using ystals. Each successive member of the echelon has one more crystal than the preceeding member. Thus, each ray of an incident X-ray or gamma ray beam is reflected by a different amount and the reflected rays may be directed through a common focal point.
REFERENCES:
patent: 3160749 (1964-12-01), Spielberg
Church Craig E.
Dunn Aubrey J.
Harwell Max L.
Lane Anthony T.
The United States of America as represented by the Secretary of
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