LandOfFree - US Patents - Listing for X-ray or gamma ray systems or devices,Specific application,Diffraction, reflection, or scattering analysis

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Radiation scatter apparatus and method

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Radiographic sensitivity for detection of flaws and cracks

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Radioisotope based x-ray residual stress analysis apparatus

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Radiometric thickness measurement gage

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Rapid X-ray diffraction screening method of polymorph...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Reflective mirror for soft x-ray exposure apparatus

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Reflectivity and resolution X-ray dispersive and reflective stru

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Refractive X-ray arrangement

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Refractive x-ray element

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Rise time measurement for ultrafast X-ray pulses

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Sample alignment mechanism for X-ray diffraction...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Sample changer for capillary geometry X-ray diffractometers

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Sample holder for X-ray diffractometry

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Sample mounts for microcrystal crystallography

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Sample mounts for microcrystal crystallography

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Scanning line detector for two-dimensional x-ray diffractometer

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Scanning monochromator crystal and related method

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Scanning monochrometer crystal and method of formation

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Scanning X-ray inspection system using scintillation...