Scanning line detector for two-dimensional x-ray diffractometer

Details Scanning line detector for two-dimensional x-ray diffractometer Scanning line detector for two-dimensional x-ray diffractometer

2007-03-13

2007-03-13

Thomas, Courtney (Department: 2882)

X-ray or gamma ray systems or devices

Specific application

Diffraction, reflection, or scattering analysis

C378S071000

Reexamination Certificate

active

10977251

ABSTRACT:
A scanning line detector according to the present invention uses a detector with a linear arrangement of detection elements that is moved along a range of diffracted x-ray directions to collect data across a multidimensional detection area. The scanning line detector allows for the simulation of a two-dimensional detector system without the need for a two-dimensional detector. The detector may follow a desired path to simulate a desired shape, such as a cylinder. A slit may be included to limit the detector line width, and a scatter shield may be used to minimize noise from air-scattered x-rays. The detector may also use a specially designed monochromator for conditioning the diffracted x-rays. The detector may be rotatable about an axis parallel to a direction along which x-rays are diffracted, allowing it to be used in different orientations.

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He, Bob, “Introduction to Two-Dimensional X-Ray Diffraction”, Powder Diffraction, vol. 18, No. 2, Jun. 2003, pp. 71-85, USA.

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