X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent
1991-01-16
1992-06-30
Howell, Janice A.
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
378 71, 378 81, 378 73, 378205, 378208, 2504911, G01N 2320
Patent
active
051270390
ABSTRACT:
A sample holder for use with X-ray diffractometers with the capability to rotate the sample, as well as to adjust the position of the sample in the x, y, and z directions. Adjustment in the x direction is accomplished through loosening set screws, moving a platform, and retightening the set screws. Motion translators are used for adjustment in the y and z directions. An electric motor rotates the sample, and receives power from the diffractometer.
REFERENCES:
patent: 4525852 (1985-06-01), Rosenberg
patent: 4641329 (1987-02-01), Green et al.
patent: 4771446 (1988-09-01), Howe et al.
patent: 4788702 (1988-11-01), Howe et al.
Chu Kim-Kwok
Gaetjens Paul D.
Howell Janice A.
Moser William R.
The United States of America as represented by the United States
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