X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate
2004-03-22
2009-06-16
Glick, Edward J (Department: 2882)
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
C378S084000, C359S678000, C359S834000
Reexamination Certificate
active
07548607
ABSTRACT:
For reducing absorption in a refractive element, the present invention relates to a refractive element (10, 20), suitable for refracting x-rays, comprising a body with low-Z material having a first end adapted to receive rays emitted from a ray source and a second end from which the rays received at the first end emerge. The refractive element comprises columns of stacked substantially identical prisms (21). The invention also relates to lens element.
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patent: 6215920 (2001-04-01), Whitehead et al.
patent: 6668040 (2003-12-01), Cederstrom
patent: 2003/0210763 (2003-11-01), Polichar et al.
patent: 514223 (2001-01-01), None
patent: WO-01/06518 (2001-01-01), None
patent: WO-01/12345 (2001-02-01), None
Cederstrom, et al., Multi-Prism X-ray Lens, Aug. 19, 2002, IEEE; Applied Physics Letters, vol. 81, No. 8, pp. 1399-1401.
Cederstrom, Bjorn. A Multi-Prism Lens for Hard X-rays, Nov. 8, 2002, Thesis-Kungl Tekniska Hogskolan, Stockholm, pp. 5-7, 18, 37-54, 57-60, 69-76, 87-89, 109-112.
Glick Edward J
Lerner David Littenberg Krumholz & Mentlik LLP
Midkiff Anastasia
Sectra Mamea AB
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