X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate
2007-08-28
2007-08-28
Davis, Robert B. (Department: 1722)
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
C378S071000, C378S073000, C378S074000, C378S069000, C378S080000, C378S081000, C378S205000, C378S206000, C378S208000, C378S068000, C269S047000, C269S287000, C269S900000, C269S908000, C269S909000, C250S440110, C250S442110, C250S491100, C029S281100
Reexamination Certificate
active
11228455
ABSTRACT:
Sample mounts (10) for mounting microcrystals of biological macromolecules for X-ray crystallography are prepared by using patterned thin polyimide films (12) that have curvature imparted thereto, for example, by being attached to a curved outer surface of a small metal rod (16). The patterned film (12) preferably includes a tapered tip end (24) for holding a crystal. Preferably, a small sample aperture is disposed in the film for reception of the crystal. A second, larger aperture can also be provided that is connected to the sample aperture by a drainage channel, allowing removal of excess liquid and easier manipulation in viscous solutions. The curvature imparted to the film (12) increases the film's rigidity and allows a convenient scoop-like action for retrieving crystals. The polyimide contributes minimally to background and absorption, and can be treated to obtain desired hydrophobicity or hydrophilicity.
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Kmetko Jan
O'Neill Kevin
Stum Zachary
Thorne Robert E.
Cornell Research Foundation Inc.
Davis Robert B.
Jones Tullar & Cooper P.C.
Rao G. Nagesh
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