X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate
2005-04-05
2005-04-05
Ho, Allen C. (Department: 2882)
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
C378S063000, C378S070000, C378S086000, C378S098800, C250S336100, C250S370090, C250S591000
Reexamination Certificate
active
06876723
ABSTRACT:
A pump-probe scheme measures the rise time of ultrafast x-ray pulses. Conventional high speed x-ray diagnostics (x-ray streak cameras, PIN diodes, diamond PCD devices) do not provide sufficient time resolution to resolve rise times of x-ray pulses on the order of 50 fs or less as they are being produced by modern fast x-ray sources. Here, we are describing a pump-probe technique that can be employed to measure events where detector resolution is insufficient to resolve the event. The scheme utilizes a diamond plate as an x-ray transducer and a p-polarized probe beam.
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Celliers Peter M.
Moon Stephen J.
Weber Franz A.
Daubenspeck William C.
Gottlieb Paul A.
Ho Allen C.
The United States of America as represented by the Department of
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