Radiation scatter apparatus and method

Details Radiation scatter apparatus and method Radiation scatter apparatus and method

1983-03-22

1985-06-25

Smith, Alfred E.

X-ray or gamma ray systems or devices

Specific application

Diffraction, reflection, or scattering analysis

250266, G01N 2300, G01T 116, G01V 500, H01J 3900

Patent

active

045258546

ABSTRACT:
A radiation scatter gauge includes multiple detector locations for developing separate and independent sets of data from which multiple physical characteristics of a thin material and underlying substrate may be determined. In an illustrated embodiment, the apparatus and method of the invention are directed to determining characteristics of resurfaced pavement by nondestructive testing. More particularly, the density and thickness of a thin asphalt overlay and the density of the underlying pavement may be determined.

REFERENCES:
patent: 2997586 (1961-08-01), Scherbatskoy
patent: 3148279 (1964-09-01), Skala
patent: 3202822 (1965-08-01), Kehler
patent: 3840746 (1974-10-01), Kehler
patent: 4123654 (1978-10-01), Reiss et al.
patent: 4297575 (1981-10-01), Smith et al.

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