Scanning X-ray inspection system using scintillation...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C378S057000

Reexamination Certificate

active

07965816

ABSTRACT:
X-ray radiation is transmitted through and scattered from an object under inspection to detect weapons, narcotics, explosives or other contraband. Relatively fast scintillators are employed for faster X-ray detection efficiency and significantly improved image resolution. Scatter and transmission images of the object are displayed, at least one being colorized in accordance with the effective atomic number of constituents of the object. Soft switching between photon-counting and photon integration modes reduces noise and significantly increases overall image quality.

REFERENCES:
patent: RE28544 (1975-09-01), Stein et al.
patent: 5260982 (1993-11-01), Fujii et al.
patent: 5313511 (1994-05-01), Annis et al.
patent: 6661867 (2003-12-01), Mario et al.
patent: 7072440 (2006-07-01), Mario et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Scanning X-ray inspection system using scintillation... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Scanning X-ray inspection system using scintillation..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Scanning X-ray inspection system using scintillation... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2728789

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.