X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate
2008-08-14
2010-02-09
Ho, Allen C. (Department: 2882)
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
C378S205000, C378S208000
Reexamination Certificate
active
07660389
ABSTRACT:
In an X-ray diffraction apparatus, a sample holder has a sample mounted on a pin extending a known distance from a cap that mates with a magnetized base on a goniometer. The sample is mechanically positioned in the center of an X-ray beam by a first movable arm which is located in a precise position relative to the goniometer base by a positioning mechanism and a mechanism that forces the pin into engagement with the first arm. The sample has a known height on the pin with respect to the cap and therefore, the sample can repeatedly be located in the center of the X-ray beam without the use of complex centering arrangements. In order to allow the sample holder to be removed from the goniometer base, a linkage is provided that releases the pin from the first arm.
REFERENCES:
patent: 3614229 (1971-10-01), Denne
patent: 3723006 (1973-03-01), Thomas, Jr.
patent: 3736426 (1973-05-01), Anderson et al.
patent: 4759130 (1988-07-01), Goldowsky
patent: 4770593 (1988-09-01), Anderson
patent: 6608883 (2003-08-01), Olson et al.
patent: 6888920 (2005-05-01), Blank et al.
patent: 7274769 (2007-09-01), Nordmeyer et al.
Cipriani, et al., “Automation of Sample Mounting for Macromolecular Crystallography”, Biologoical Crystallography, Acta Crystallographica, Section D, 2006, pp. 1251-1259, 2006 International Union of Crystallography, Denmark.
http://www.mitegen.com/products/micromounts/why.shtml, “Why Use MicroMounts?”.
Artman Thomas R
Bruker AXS Inc.
Ho Allen C.
Law Offices of Paul E. Kudirka
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