Radiometric thickness measurement gage

Details Radiometric thickness measurement gage Radiometric thickness measurement gage

1993-05-07

1995-05-23

Porta, David P.

X-ray or gamma ray systems or devices

Specific application

Diffraction, reflection, or scattering analysis

378 54, 378 90, G01B 1502

Patent

active

054188300

ABSTRACT:
Radiometric gage for contactless measurement of the surface density or the thickness of a flat product, includes:

REFERENCES:
patent: 3617788 (1971-11-01), Goorissen et al.
patent: 4095106 (1978-06-01), Wallace
patent: 4228351 (1980-10-01), Snow et al.
patent: 4510577 (1985-04-01), Tsujii et al.
"On Line Non-Contact Thickness Measurement of Flat Rolled Materials", Conf. Record of 1989 IEEE Industry Aplns. Society Annual Mtg. Part II, Mitchell, 1989, pp. 1481-1486.
H. Semat, "Introduction to Atomic and Nuclear Physics", published 1962, Chapman and Hall, see pp. 157-161.

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