X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent
1986-02-26
1989-02-21
Church, Craig E.
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
378 82, G01N 2320
Patent
active
048072680
ABSTRACT:
A doubly-curved crystal for use in a scanning monochromator is oriented with respect to a reference plane containing source and image locations of the monochromator. The crystal has concave planes of lattice points and a concave crystal surface which satisfy Johannson geometric conditions within the reference plane for a Rowland circle of radius R. The planes of lattice points are substantially spherically curved to a radius of 2R, and the crystal surface is substantially toroidally curved with a radius of substantially 2R within a plane perpendicular to the reference plane. The crystal may be formed by plastically deforming a cylindrically curved crystal blank over a doubly-curved convex die.
REFERENCES:
patent: 2853617 (1958-09-01), Berreman
patent: 3772522 (1973-11-01), Hammond et al.
patent: 3777156 (1973-12-01), Hammond et al.
patent: 3898455 (1975-08-01), Furnas
patent: 4203034 (1980-03-01), Carroll, Jr.
patent: 4351063 (1982-09-01), Dineen et al.
patent: 4446568 (1984-05-01), Williams et al.
patent: 4649557 (1987-03-01), Hornstra
Despujols, J. "Monochromator pour rayons X a foyer ponctuel," Compt. Rend. 235, 716-718 (1952).
Despujols, J. Roulet, J. and Senemeaud, G., "X-ray fluorescence analysis with focused primary beam," in X-Ray Optics and X-Ray Microanalysis, Ed. by Pattee, Cosselett and Engstrom, Academic Press, NY, 1963, pp. 445-449.
Hagg, G. and Karlsson, N., "Aluminum monochromator with double curvature for high intensity x-ray powder photographs," Acta Cryst. 5, 728-730 (1952).
Berreman, D. W., Dumond, J. W. M. and Marmier, P. E., "New point-focusing monochromator," Rev. Sci. Instr. 25, 1219 (1954).
Berreman, D. W., "Single quartz crystal point focusing x-ray monochromator," Rev. Sci., Instr. 26, 1048-1052 (1956).
Berreman, D. W., Stamatoff, J. and Kennedy, S. J., "Doubly Curved crystal point-focusing x-ray monochromators: geometrical and practical optics," App. Optics, 16, 2081-5 (1977).
Barnstad, G. E. B. and Refsdal, I. H., "Sensitive Qualitative Recording X-Ray Spectrometer," Rev. Sci. Instr. 29, 3423-8 (1958).
Wassberg, G. and Siegbahn, K., "Small Angle scattering of X-rays," Ark. f. Phsik. 14, 1-15 (1958).
Hagstrom, S. and Siegbahn, K., "A Small Angle X-ray Scattering Apparatus Using a Spherically Bent Crystal," J. Ultrastr. Res. 3, 401-419 (1960).
Egg, J. and Ulmer, K., "X-Ray spectroscopy with spherically bent crystals," (in Ger.) Z. Angew, Phy. 20, 118-28 (1965).
Ehrhardt, C. H., et al., "Application of spherically curved crystals for X-Ray fluorescence," App. Spect. 22, 730-8 (1968).
Witz, J., "Focusing monochromators," Act Cryst. A25, 30-42 (1969).
Das Gupta, K., et al., "Some new methods of precision x-ray spectrometry," Advances in X-ray Analysis, vol. 16, 251-9 (1972).
Parker, D. L., "A spherically bent crystal x-ray spectrometer with variable curvature," Advances in X-Ray Analysis, vol. 17, 521-30 (1973).
Warren, B. E., "Monochromatic X-rays for single crystal diffuse scattering," Rev. Sci. Instr. 814-5 (1954).
Bosslet, J. A., et al., "Determination of parts per billion levels of electrodeposited metals by energy dispersive x-ray fluorescence spectrometry," Anl. Chem. 49, 1734-7 (1977).
Marcus, M., et al., "Curved-crystal x-ray focusing array for fluorescence EXAFS in dilute samples," Rev. Sci. Instrum 51, 1023-9 (1980).
Hastings, J. B., et al., "Local-Structure Determination at High Dilution: Internal Oxidation of 75-ppm Fe in Cu," Phys. Rev. Lett. 43, 1807-10 (1979).
Birks, L. S., X-Ray Spectrochemical Analysis, Interscience Publishers, Inc., New York, 1959, pp. 127-131.
Websters's Seventh New Collegiate Dictionary, G. C. Merriam Co., Springfield, Mass. 1965, p. 934.
Church Craig E.
Grigsby T. N.
University of Southern California
LandOfFree
Scanning monochrometer crystal and method of formation does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Scanning monochrometer crystal and method of formation, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Scanning monochrometer crystal and method of formation will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1528762