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Semiconductor memory device having on-chip test circuit and oper

Static information storage and retrieval – Read/write circuit – Testing
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Semiconductor memory device having output data buffer unit share

Static information storage and retrieval – Read/write circuit – Testing
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Semiconductor memory device having parallel test mode for...

Static information storage and retrieval – Read/write circuit – Testing
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Semiconductor memory device having redundant circuit

Static information storage and retrieval – Read/write circuit – Testing
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Semiconductor memory device having redundant memory cell columns

Static information storage and retrieval – Read/write circuit – Testing
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Semiconductor memory device having resistive bitline contact...

Static information storage and retrieval – Read/write circuit – Testing
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Semiconductor memory device having row and column redundancy...

Static information storage and retrieval – Read/write circuit – Testing
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Semiconductor memory device having selection circuit for arbitra

Static information storage and retrieval – Read/write circuit – Testing
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Semiconductor memory device having test circuit

Static information storage and retrieval – Read/write circuit – Testing
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Semiconductor memory device having test circuit

Static information storage and retrieval – Read/write circuit – Testing
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Semiconductor memory device having test mode

Static information storage and retrieval – Read/write circuit – Testing
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Semiconductor memory device having test mode

Static information storage and retrieval – Read/write circuit – Testing
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Semiconductor memory device having test mode

Static information storage and retrieval – Read/write circuit – Testing
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Semiconductor memory device having test mode

Static information storage and retrieval – Read/write circuit – Testing
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Semiconductor memory device having test mode

Static information storage and retrieval – Read/write circuit – Testing
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Semiconductor memory device having test mode and memory...

Static information storage and retrieval – Read/write circuit – Testing
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Semiconductor memory device having test mode and method for...

Static information storage and retrieval – Read/write circuit – Testing
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Semiconductor memory device having test mode and method of setti

Static information storage and retrieval – Read/write circuit – Testing
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Semiconductor memory device having test pattern generating circu

Static information storage and retrieval – Read/write circuit – Testing
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Semiconductor memory device having testing function and testing

Static information storage and retrieval – Read/write circuit – Testing
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