Static information storage and retrieval – Read/write circuit – Testing
Patent
1990-02-26
1991-01-01
Moffitt, James W.
Static information storage and retrieval
Read/write circuit
Testing
36518905, 371 211, G11C 2900
Patent
active
049823809
ABSTRACT:
For decreasing a semiconductor chip where a semiconductor memory device is fabricated, a memory cell unit and a diagnostic unit are coupled to an output buffer unit through a single data path, and an auxiliary gate control unit is provided in association with the output buffer unit for shifting an output data pin between a high level, a low level and a high impedance state, in which the diagnostic unit checks a plurality of data bits from the memory cell unit to see whether or not the data bits are consistent with one another for producing a first diagnostic signal of either high or low level in a basic testing function but for producing second and third diagnosis signals for shifting the output data pin between the high and low levels and a high impedance state, in which the auxiliary gate control unit steers the output buffer unit in response to the first diagnosis signal or the third diagnosis signal on the single data path but the second diagnosis signal causes the auxiliary gate control unit to steer the output buffer unit for the high impedance state.
REFERENCES:
patent: 3944800 (1976-03-01), Beck et al.
patent: 4481627 (1984-11-01), Beauchesne et al.
patent: 4881200 (1989-11-01), Urai
Moffitt James W.
NEC Corporation
LandOfFree
Semiconductor memory device having output data buffer unit share does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Semiconductor memory device having output data buffer unit share, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor memory device having output data buffer unit share will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2002013