Static information storage and retrieval – Read/write circuit – Testing
Patent
1993-02-01
1993-09-07
Clawson, Jr., Joseph E.
Static information storage and retrieval
Read/write circuit
Testing
365 63, 36518901, 3652257, 36523003, 36523006, 371 101, G11C 506, G11C 2900
Patent
active
052435709
ABSTRACT:
A semiconductor memory device is rescued from a defective product by replacing a column of regular memory cells containing a defective memory cell with a column of redundant memory cells, and allows a multi-bit data code to be read out partially from regular memory cell arrays as well as partially from the column of the redundant memory cells by permanently disabling a regular column address decoder circuit associated with the column of the regular memory cells replaced with the column of the redundant memory cells so that the other memory cell arrays and the column of the redundant memory cells become concurrently accessible.
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Clawson Jr. Joseph E.
NEC Corporation
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