Semiconductor memory device having a bit compressed test mode an
Semiconductor memory device having a burn-in control circuit and
Semiconductor memory device having a circuit for fast operation
Semiconductor memory device having a circuit for fast operation
Semiconductor memory device having a circuit for testing...
Semiconductor memory device having a memory test circuit
Semiconductor memory device having a plurality of signal...
Semiconductor memory device having a self-diagnosing function
Semiconductor memory device having a test cell array
Semiconductor memory device having a test mode and...
Semiconductor memory device having a test mode decision circuit
Semiconductor memory device having a test mode setting circuit
Semiconductor memory device having a testing function and method
Semiconductor memory device having access time control circuit
Semiconductor memory device having an address key circuit for re
Semiconductor memory device having an improved error correction
Semiconductor memory device having an open bit line...
Semiconductor memory device having burn-in mode operation stably
Semiconductor memory device having burn-in mode operation...
Semiconductor memory device having burn-in test circuit