Semiconductor memory device having a testing function and method

Details Semiconductor memory device having a testing function and method Semiconductor memory device having a testing function and method

1991-12-13

1994-08-16

LaRoche, Eugene R.

Static information storage and retrieval

Read/write circuit

Testing

365149, 365205, G11C 2900, G11C 700

Patent

active

053392736

ABSTRACT:
A semiconductor memory device is provided with a plurality of bit lines, a plurality of word lines, a memory cell array including a plurality of memory cells each coupled to one bit line and one word line, and a varying part for varying a capacitance of at least a selected one of the bit lines in response to a predetermined signal which indicates a test mode in which an operation of the semiconductor memory device is tested.

REFERENCES:
patent: 4799197 (1989-01-01), Kodama et al.
patent: 4956819 (1990-09-01), Hoffmann et al.

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