Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate
2005-09-06
2005-09-06
Ho, Hoai (Department: 2827)
Static information storage and retrieval
Read/write circuit
Testing
C365S189090, C365S191000, C365S196000, C365S230060
Reexamination Certificate
active
06940767
ABSTRACT:
A write-driver/read-amplifier circuit includes a write driver, a GIO equalize circuit and a read amplifier. When a current leaks from or to global data line, a signal applied to a logic gate attains L-level. As a result, the write driver and the GIO equalize circuit stop the operations so that a semiconductor memory device can prevent occurrence of an unnecessary leak current.
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K. Kanda et al., “Abnormal Leakage Suppression (ALS) Scheme for Low Standby Current SRAMs”, ISSCC 2001, pp. 174-175.
Ooishi Tsukasa
Tanizaki Hiroaki
Ho Hoai
McDermott Will & Emery LLP
Mitsubishi Electric Engineering Company Limited
Pham Ly Duy
Renesas Technology Corp.
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