Variable temperature scanning tunneling microscope

Variable temperature stage device for electron microscope

Vertical direction force transducer

Vertically aligned nanostructure scanning probe microscope tips

Vibration cancellation system for a charged particle beam appara

Vibration cancellation system for scanning electron microscopes

Vibration-isolating coupling including an elastomer...

Vibration-type cantilever holder and scanning probe microscope

Visual color mapping X-ray analysis apparatus

Voice coil scanner for use in scanning probe microscope

Void characterization in metal interconnect structures using...

Voltage contrast detector for a scanning electron beam instrumen

Wafer chuck, exposure system, and method of manufacturing...

Wafer fixing unit for focused ion beam apparatus

Wafer height correction system for focused beam system

Wafer holder and sample producing apparatus using it

Wafer holder for simox processing

Wafer holding device in an exposure apparatus

Wafer inspection system and wafer inspection process using...

Wafer pedestal tilt mechanism and cooling system