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Data acquisition and control apparatus for scanning probe system

Radiant energy – Inspection of solids or liquids by charged particles
Patent

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Data channel multiplexing system for CT scanner with rotating so

Radiant energy – Inspection of solids or liquids by charged particles – Analyte supports
Patent

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Data transmission in radiographic apparatus

Radiant energy – Inspection of solids or liquids by charged particles – Analyte supports
Patent

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Deconvolving far-field images using scanned probe data

Radiant energy – Inspection of solids or liquids by charged particles – Methods
Reexamination Certificate

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Deconvolving far-field images using scanned probe data

Radiant energy – Inspection of solids or liquids by charged particles – Methods
Reexamination Certificate

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Defect detection and thickness mapping of the passivation layer(

Radiant energy – Inspection of solids or liquids by charged particles – Methods
Patent

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Defect detection using energy spectrometer

Radiant energy – Inspection of solids or liquids by charged particles – Electron microscope type
Reexamination Certificate

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Defect evaluation apparatus utilizing positrons

Radiant energy – Inspection of solids or liquids by charged particles – Positive ion probe or microscope type
Reexamination Certificate

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Defect inspection and charged particle beam apparatus

Radiant energy – Inspection of solids or liquids by charged particles – Electron probe type
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Defect inspection and charged particle beam apparatus

Radiant energy – Inspection of solids or liquids by charged particles – Electron probe type
Reexamination Certificate

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Defect inspection apparatus and defect inspection method

Radiant energy – Inspection of solids or liquids by charged particles – Electron probe type
Reexamination Certificate

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Defect inspection apparatus, program, and manufacturing...

Radiant energy – Inspection of solids or liquids by charged particles – Electron probe type
Reexamination Certificate

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Defect inspection efficiency improvement with in-situ...

Radiant energy – Inspection of solids or liquids by charged particles – Methods
Reexamination Certificate

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Defect inspection instrument and positron beam apparatus

Radiant energy – Inspection of solids or liquids by charged particles – Including a radioactive source
Reexamination Certificate

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Defect inspection method and apparatus therefor

Radiant energy – Inspection of solids or liquids by charged particles – Electron probe type
Utility Patent

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Defect inspection method and its system

Radiant energy – Inspection of solids or liquids by charged particles
Reexamination Certificate

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Defect observing electron microscope

Radiant energy – Inspection of solids or liquids by charged particles – Electron microscope type
Patent

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Defect review method and device for semiconductor device

Radiant energy – Inspection of solids or liquids by charged particles
Reexamination Certificate

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Defect review SEM with automatically switchable detector

Radiant energy – Inspection of solids or liquids by charged particles – Electron probe type
Reexamination Certificate

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Defect-review SEM, reference sample for adjustment thereof,...

Radiant energy – Inspection of solids or liquids by charged particles – Electron probe type
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