Sample analysis apparatus using electron beam irradiation

Sample analyzer

Sample analyzing apparatus

Sample carriage for scanning probe microscope

Sample carrier for carrying a sample to be irradiated with...

Sample cell

Sample charging control in charged-particle systems

Sample dimension measuring method and scanning electron...

Sample dimension measuring method and scanning electron...

Sample dimension measuring method and scanning electron...

Sample distortion removing method in thin piece forming

Sample electrification measurement method and charged...

Sample electrification measurement method and charged...

Sample electrification measurement method and charged...

Sample electrification measurement method and charged...

Sample for transmission electron microscope analysis having no c

Sample heating holder, method of observing a sample and...

Sample height regulating method, sample observing method,...

Sample holder and ion-beam processing system

Sample holder and ion-beam processing system