Ultimate analyzer, scanning transmission electron microscope...

Ultimate analyzer, scanning transmission electron microscope...

Ultra-high tilt specimen cryotransfer holder for electron micros

Ultra-high vacuum apparatus

Ultra-thin liquid control plate and combination of box-like...

Ultra-thin sample preparation for transmission electron...

Ultrafast scanning probe microscopy

Ultrafine silicon tips for AFM/STM profilometry

Ultraviolet laser-generating device and defect inspection...

Undercut measurement using SEM

Universal, microfabricated probe for scanning probe microscopes

Unsupported, electron transparent films and related methods

Unsupported, electron transparent films and related methods

Use of carbon nanotubes as chemical sensors by incorporation...

Use of focused ion and electron beams for fabricating a sensor o

Use of multiple tips on AFM to deconvolve tip effects

Use of scanning probe microscope for defect detection and...

Using a crystallographic etched silicon sample to measure...