Cable-supporting arrangement for X-ray tomographic scanner

Calibration of CD-SEM by e-beam induced current measurement

Calibration substrate and method for calibrating a...

Cantilever and measuring apparatus using it

Cantilever array and scanning probe microscope including a...

Cantilever array, method for fabricating the same, scanning...

Cantilever array, method for fabricating the same, scanning...

Cantilever assembly and scanning tip therefor with...

Cantilever chip

Cantilever chip for scanning probe microscope

Cantilever holder and scanning probe microscope

Cantilever type displacement element, and scanning tunneling mic

Cantilever type probe, and scanning tunnel microscope and inform

Cantilever type probe, scanning tunneling microscope and informa

Capping layer to impede atom ejection

Carbon nanotube probes in atomic force microscope to detect...

Carbon tube for electron beam application

Carrier and analyzing apparatus including the carrier

Cassette retaining device of electron beam apparatus

Cathode, electron beam emission apparatus using the same, and me