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Computer joystick

Optics: measuring and testing – By configuration comparison – With projection on viewing screen
Reexamination Certificate

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Computerized micromeasuring system and method therefor

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Contact-free optical linear measurement device

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Contactless thickness measuring apparatus and measuring method f

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Contour detecting and dimension measuring apparatus

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Contour inspection

Optics: measuring and testing – By configuration comparison – With two images of single article compared
Patent

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Cross-sectional area measuring machine

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Defect detection through image comparison using relative...

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Reexamination Certificate

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Defect inspection system for phase shift masks

Optics: measuring and testing – By configuration comparison – With two images of single article compared
Patent

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Depositing a material of controlled, variable thickness...

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Reexamination Certificate

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Detection method using electromagnetic wave and detection...

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Reexamination Certificate

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Detection of phase defects on photomasks by differential...

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Reexamination Certificate

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Detector pulse enhancement circuit

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Determination of dimensions of tubes

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Determination of refractive index and thickness of thin layers

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Determining photoresist parameters using optical metrology

Optics: measuring and testing – By configuration comparison – With projection on viewing screen
Reexamination Certificate

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Device and method for determining an optical property of a mask

Optics: measuring and testing – By configuration comparison
Reexamination Certificate

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Device and method for end-point monitoring used in the polishing

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Device and method for observing and analyzing a stream of materi

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Device for automatically determining the deviation between the s

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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