Contour inspection

Optics: measuring and testing – By configuration comparison – With two images of single article compared

Patent

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Details

350174, 356391, 356376, G01B 1124, G02B 2714

Patent

active

041474333

ABSTRACT:
A method and apparatus for inspecting the contour of an article is disclosed. Nondestructive viewing techniques including the projection of a light pattern onto the article to be inspected and the imaging of said light pattern to a display screen are discussed. The concepts taught enable the viewing of article regions which were formerly obstructed in conventional viewing systems.

REFERENCES:
patent: 2607267 (1952-08-01), Fultz et al.
patent: 2741153 (1956-04-01), Reason et al.
patent: 3271097 (1966-09-01), Montremy et al.

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