Detector pulse enhancement circuit

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate

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Details

250560, G01B 1108

Patent

active

041992598

ABSTRACT:
An optical gauging device wherein a laser beam is deflected to produce a bidirectional scan; a measuring portion of the split beam scans an object being inspected while the other portion scans a calibration reticle having alternating opaque and transparent bands. The alternating transmission and occultation of the beam through the reticle is used to generate calibration pulses, each representing a predetermined increment of movement of the calibration beam. The measuring portion of the beam is converted into parallel light beams which in turn are occulted by the workpiece being measured. A series of high and low square wave pulses are generated that are operative to start and stop the count of the calibration pulses. The count of the calibration pulses is directly related to the dimension of the workpiece being measured. A detector pulse enhancement circuit converts the measured signals to an accurate set of timing pulses independent of scan velocity, part size, part composition and interfering noise. The pulse generation utilizes a variable gain amplifier to provide a one-to-one output except upon the detection of a measuring signal.

REFERENCES:
patent: 3856412 (1974-12-01), Zanoni
patent: 3905705 (1975-09-01), Petrohilos
patent: 4025796 (1977-05-01), Erdmann
patent: 4043673 (1977-08-01), Harris et al.

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