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Process and apparatus for in-situ qualification of master patter

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
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Process and device for checking the conformity of hybridization

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
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Process for determining and monitoring the shape of the edges of

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Profile imaging techniques

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
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QFP lead quality inspection system and method

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
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Recognition device for recognizing the shape and the position of

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
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Reference image forming method and pattern inspection apparatus

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
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Reflectance method for evaluating the surface...

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Reexamination Certificate

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Reflectance method for evaluating the surface...

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
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Reticle used in semiconductor device fabrication and a method fo

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Sample CD measurement system

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Sample inspection apparatus and sample inspection method

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
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Seal dispenser for fabricating liquid crystal display panel...

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
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Solder joint inspection system and method

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
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Solid-state image pickup device and signal reading method...

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
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Solid-state image pickup device and signal reading method...

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
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Substrate machining verifier

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
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Substrate machining verifier

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
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System and method of inspecting connector coupling condition

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
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System and method of three-dimensional inspection of...

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