QFP lead quality inspection system and method

Details QFP lead quality inspection system and method QFP lead quality inspection system and method

1993-04-16

1995-04-11

Pham, Hoa Q.

Optics: measuring and testing

By configuration comparison

With comparison to master, desired shape, or reference voltage

356376, 356237, 250561, 348 87, 348126, G01B 1124

Patent

active

054063728

ABSTRACT:
The leads of a QFP are examined by an optical system. The optical system includes a sensor head having two lasers, the outputs of the lasers being fed to a beam splitter which provides outputs at right angles to each other, and a ring-light which is disposed under the beam splitter and in actual alignment with the beam splitter. The sensor head is carried by a carriage in a single plane along two transverse directions. The carriage moves the sensor heads so as to examine one lead at a time along the peripheral edges of the QFP.

REFERENCES:
patent: 4739175 (1988-04-01), Tamura
patent: 4812666 (1989-03-01), Wistrand
patent: 4874956 (1989-10-01), Kato et al.
patent: 4978220 (1990-12-01), Abramovich et al.
patent: 5162866 (1992-11-01), Tomiya et al.
patent: 5192983 (1993-03-01), Tokuka

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